Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 20
Aehr Test Systems (NASDAQ:AEHR), a semiconductor test and burn-in equipment provider, will participate in the 6th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 20, 2025. CEO Gayn Erickson and CFO Chris Siu will host virtual investor meetings to discuss the company's solutions, including their recently acquired Incal Technology's high-power packaged part reliability testing capabilities.
The company's solutions serve diverse markets including silicon carbide devices for EVs, gallium nitride devices for power conversion, and silicon photonics devices for data centers and 5G infrastructure. Aehr Test also provides solutions for AI processors in both wafer level and packaged part forms.
Aehr Test Systems (NASDAQ:AEHR), fornitore di attrezzature per test e burn-in nel settore dei semiconduttori, parteciperà al 6° Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference il 20 agosto 2025. Il CEO Gayn Erickson e il CFO Chris Siu terranno incontri virtuali con investitori per illustrare le soluzioni dell’azienda, comprese le capacità di test di affidabilità per componenti ad alta potenza acquisite di recente con Incal Technology.
Le soluzioni dell’azienda servono mercati diversi, tra cui dispositivi in carburo di silicio per veicoli elettrici (EV), dispositivi in nitruro di gallio per conversione di potenza e dispositivi in fotonica su silicio per data center e infrastrutture 5G. Aehr Test fornisce inoltre soluzioni per processori AI sia a livello wafer sia per componenti confezionati.
Aehr Test Systems (NASDAQ:AEHR), proveedor de equipos de prueba y burn-in para semiconductores, participará en la 6ª Conferencia Anual Virtual Needham Semiconductor and SemiCap 1x1 el 20 de agosto de 2025. El CEO Gayn Erickson y el CFO Chris Siu mantendrán reuniones virtuales con inversores para presentar las soluciones de la compañía, incluidas las capacidades de prueba de fiabilidad para piezas empaquetadas de alta potencia adquiridas recientemente con Incal Technology.
Las soluciones de la compañía atienden a mercados diversos, incluidos dispositivos de carburo de silicio para vehículos eléctricos (EV), dispositivos de nitruro de galio para conversión de potencia y dispositivos de fotónica de silicio para centros de datos e infraestructuras 5G. Aehr Test también ofrece soluciones para procesadores de IA tanto a nivel de oblea como en piezas empaquetadas.
Aehr Test Systems (NASDAQ:AEHR), 반도체 테스트 및 번인 장비 공급업체는 2025년 8월 20일 개최되는 제6회 Needham 가상 반도체 및 SemiCap 1x1 컨퍼런스에 참가합니다. CEO 게인 에릭슨(Gayn Erickson)과 CFO 크리스 시우(Chris Siu)가 가상 투자자 미팅을 주최하여, 최근 인수한 인칼 테크놀로지(Incal Technology)의 고전력 패키지 부품 신뢰성 테스트 기능을 포함한 회사의 솔루션을 논의할 예정입니다.
회사의 솔루션은 전기차(EV)용 실리콘 카바이드 장치, 전력 변환용 갈륨 나이트라이드 장치, 데이터센터 및 5G 인프라용 실리콘 포토닉스 장치 등 다양한 시장에 적용됩니다. 또한 Aehr Test는 웨이퍼 수준과 패키지된 부품 형태 모두에서 AI 프로세서를 위한 솔루션을 제공합니다.
Aehr Test Systems (NASDAQ:AEHR), fournisseur d'équipements de test et de burn-in pour semi-conducteurs, participera à la 6e conférence annuelle virtuelle Needham Semiconductor and SemiCap 1x1 le 20 août 2025. Le PDG Gayn Erickson et le directeur financier Chris Siu animeront des rencontres virtuelles avec des investisseurs pour présenter les solutions de l'entreprise, y compris les capacités de tests de fiabilité pour pièces emballées haute puissance récemment acquises via Incal Technology.
Les solutions de la société couvrent des marchés divers tels que les dispositifs en carbure de silicium pour véhicules électriques (EV), les dispositifs en nitrure de gallium pour la conversion de puissance et les dispositifs en photonique sur silicium pour centres de données et infrastructures 5G. Aehr Test propose également des solutions pour processeurs IA tant au niveau wafer que pour pièces emballées.
Aehr Test Systems (NASDAQ:AEHR), ein Anbieter von Test- und Burn-in-Ausrüstung für Halbleiter, wird am 6. Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference am 20. August 2025 teilnehmen. CEO Gayn Erickson und CFO Chris Siu werden virtuelle Investorengespräche führen, um die Lösungen des Unternehmens vorzustellen, einschließlich der kürzlich übernommenen Incal Technology und deren Fähigkeiten zum Zuverlässigkeitstest von hochleistungsfähigen, verpackten Bauteilen.
Die Lösungen des Unternehmens bedienen verschiedene Märkte, darunter Siliziumcarbid-Bauteile für Elektrofahrzeuge (EV), Galliumnitrid-Bauteile für die Leistungsumwandlung und Silizium-Photonik-Bauteile für Rechenzentren und 5G-Infrastruktur. Aehr Test bietet zudem Lösungen für KI-Prozessoren sowohl auf Wafer-Ebene als auch für verpackte Bauteile an.
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FREMONT, CA / ACCESS Newswire / August 18, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will participate in the 6th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on Wednesday, August 20, 2025.
Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day.
"We look forward to discussing with investors and shareholders our innovative wafer level test and packaged part burn-in solutions for semiconductor production and the diverse markets they serve," said Mr. Erickson. "This includes our new high power packaged part reliability/burn-in test solutions from our acquisition of Incal Technology that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market. Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors. These include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices, as well as AI processors in both wafer level and packaged part device forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test."
For additional information, or to schedule a meeting with Aehr management, please contact your Needham representative, or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced AI processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
Contacts:
Aehr Test Systems | PondelWilkinson, Inc. |
SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire
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