Aehr Test Systems to Participate in the Susquehanna 15th Annual Technology Conference on February 26, 2026
Aehr Test Systems (NASDAQ:AEHR) will participate in the Susquehanna 15th Annual Technology Conference on February 26, 2026 at the Lotte New York Palace Hotel.
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Rhea-AI Summary
Aehr Test Systems (NASDAQ:AEHR) will participate in the Susquehanna 15th Annual Technology Conference on February 26, 2026 at the Lotte New York Palace Hotel.
President and CEO Gayn Erickson and CFO Chris Siu will host institutional investor meetings to discuss Aehr's test and burn-in solutions for AI, data center, automotive and industrial semiconductors. For meetings, contact PondelWilkinson at jbyers@pondel.com or your Susquehanna representative.
Details
News Market Reaction – AEHR
On Feb 19, the day this news came out, AEHR closed 4.34% above the previous close.
Data tracked by StockTitan Argus for the Feb 19 session.
Key Figures
- Conference edition
- 15th Annual
- Susquehanna Technology Conference
- Conference date
- February 26, 2026
- Susquehanna 15th Annual Technology Conference
Historical Context
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Initial production order for Sonoma systems for next-gen AI ASIC processors.
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Participation in Oppenheimer Emerging Growth Conference with investor meetings.
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More than $5.5M Sonoma orders and new fully automated Sonoma introduction.
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Q2 2026 loss but guidance reinstated driven by AI and data center demand.
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Needham conference presentation highlighting test and burn-in across key markets.
24h Move is the share-price change in the day after each event; other market factors may also have contributed.
Key Terms
burn-in technical
wafer-level technical
packaged-part technical
silicon carbide technical
gallium nitride technical
silicon photonics technical
5G infrastructure technical
optical input/output (I/O) technical
AI-generated analysis. How Rhea-AI works. Not financial advice.
FREMONT, CA / ACCESS Newswire / February 19, 2026 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence (AI), data center, automotive, and industrial applications, today announced that President and CEO Gayn Erickson and CFO Chris Siu will host meetings with institutional investors at the Susquehanna 15th Annual Technology Conference taking place at the Lotte New York Palace Hotel in New York on February 26, 2026.
"We look forward to discussing with investors and shareholders Aehr's expanding role in enabling the next generation of semiconductor devices across a wide range of markets," said Mr. Erickson. "Aehr delivers complete turnkey solutions that improve the quality, reliability, and yield of semiconductors used in critical applications, including AI processors in cloud computing and data centers, silicon carbide devices in electric vehicles and charging infrastructure, gallium nitride for advanced power conversion, and silicon photonics for data centers, 5G infrastructure and optical input/output (I/O). We are seeing strong traction with AI processors in both wafer-level and packaged-part formats. The growing adoption of wafer-level and packaged-part test and burn-in across these markets is expected to be a significant growth driver for Aehr Test Systems."
For additional information or to schedule a meeting with Aehr management, please contact your Susquehanna representative or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and packaged part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced artificial intelligence (AI) processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr's products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full-wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for AI semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turnkey provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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Contacts:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
PondelWilkinson, Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
tkehrli@pondel.com
jbyers@pondel.com
SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire
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