Aehr Test Systems to Present at William Blair 45th Annual Growth Stock Conference on June 3
Aehr Test Systems (NASDAQ:AEHR), a semiconductor test and burn-in equipment supplier, announced that CEO Gayn Erickson and CFO Chris Siu will present at the William Blair 45th Annual Growth Stock Conference on June 3, 2025, at 12:40pm CT. The presentation will highlight Aehr's wafer level test and packaged part burn-in solutions, including their recent acquisition of Incal Technology and expansion into the AI semiconductor market.
The company's solutions serve diverse markets, focusing on silicon carbide devices for EVs, gallium nitride devices for power conversion, and silicon photonics devices for data centers and 5G infrastructure. Aehr provides comprehensive solutions for improving semiconductor quality, reliability, and yield.
Aehr Test Systems (NASDAQ:AEHR), fornitore di apparecchiature per test e burn-in di semiconduttori, ha annunciato che il CEO Gayn Erickson e il CFO Chris Siu parteciperanno alla William Blair 45th Annual Growth Stock Conference il 3 giugno 2025 alle 12:40 CT. La presentazione metterà in evidenza le soluzioni di test a livello di wafer e burn-in di parti confezionate di Aehr, inclusa la recente acquisizione di Incal Technology e l'espansione nel mercato dei semiconduttori per l'IA.
Le soluzioni dell'azienda servono mercati diversificati, concentrandosi su dispositivi in carburo di silicio per veicoli elettrici, dispositivi in nitruro di gallio per la conversione di potenza e dispositivi di fotonica a silicio per data center e infrastrutture 5G. Aehr offre soluzioni complete per migliorare la qualità, l'affidabilità e la resa dei semiconduttori.
Aehr Test Systems (NASDAQ:AEHR), proveedor de equipos para pruebas y burn-in de semiconductores, anunció que el CEO Gayn Erickson y el CFO Chris Siu presentarán en la William Blair 45th Annual Growth Stock Conference el 3 de junio de 2025 a las 12:40 pm CT. La presentación destacará las soluciones de prueba a nivel de oblea y burn-in de piezas empaquetadas de Aehr, incluyendo su reciente adquisición de Incal Technology y su expansión en el mercado de semiconductores para IA.
Las soluciones de la compañía atienden a mercados diversos, enfocándose en dispositivos de carburo de silicio para vehículos eléctricos, dispositivos de nitruro de galio para conversión de potencia y dispositivos de fotónica de silicio para centros de datos e infraestructura 5G. Aehr ofrece soluciones integrales para mejorar la calidad, confiabilidad y rendimiento de los semiconductores.
Aehr Test Systems (NASDAQ:AEHR)는 반도체 테스트 및 번인 장비 공급업체로, CEO 게인 에릭슨(Gayn Erickson)과 CFO 크리스 시우(Chris Siu)가 2025년 6월 3일 오후 12시 40분 CT에 열리는 William Blair 제45회 연례 성장주 컨퍼런스에서 발표할 예정이라고 발표했습니다. 이번 발표에서는 Aehr의 웨이퍼 레벨 테스트 및 패키지 부품 번인 솔루션, 최근 인수한 인칼 테크놀로지(Incal Technology)와 AI 반도체 시장으로의 확장에 대해 다룰 예정입니다.
회사의 솔루션은 다양한 시장에 서비스를 제공하며, 전기차용 실리콘 카바이드 디바이스, 전력 변환용 갈륨 나이트라이드 디바이스, 데이터 센터 및 5G 인프라용 실리콘 포토닉스 디바이스에 중점을 두고 있습니다. Aehr는 반도체의 품질, 신뢰성 및 수율 향상을 위한 종합 솔루션을 제공합니다.
Aehr Test Systems (NASDAQ:AEHR), fournisseur d'équipements de test et de burn-in pour semi-conducteurs, a annoncé que le PDG Gayn Erickson et le directeur financier Chris Siu présenteront lors de la William Blair 45th Annual Growth Stock Conference le 3 juin 2025 à 12h40 CT. La présentation mettra en avant les solutions de test au niveau du wafer et de burn-in des pièces emballées d'Aehr, y compris leur récente acquisition d'Incal Technology et leur expansion sur le marché des semi-conducteurs pour l'IA.
Les solutions de l'entreprise desservent divers marchés, en se concentrant sur les dispositifs en carbure de silicium pour véhicules électriques, les dispositifs en nitrure de gallium pour la conversion d'énergie, et les dispositifs en photonique sur silicium pour les centres de données et les infrastructures 5G. Aehr propose des solutions complètes pour améliorer la qualité, la fiabilité et le rendement des semi-conducteurs.
Aehr Test Systems (NASDAQ:AEHR), ein Anbieter von Test- und Burn-in-Ausrüstung für Halbleiter, gab bekannt, dass CEO Gayn Erickson und CFO Chris Siu am 3. Juni 2025 um 12:40 Uhr CT auf der William Blair 45th Annual Growth Stock Conference präsentieren werden. Die Präsentation wird Aehrs Lösungen für Wafer-Level-Tests und Burn-in von verpackten Bauteilen hervorheben, einschließlich der kürzlichen Übernahme von Incal Technology und der Expansion in den KI-Halbleitermarkt.
Die Lösungen des Unternehmens bedienen verschiedene Märkte mit Fokus auf Siliziumkarbid-Bauelemente für Elektrofahrzeuge, Galliumnitrid-Bauelemente für die Leistungsumwandlung und Silizium-Photonik-Bauelemente für Rechenzentren und 5G-Infrastruktur. Aehr bietet umfassende Lösungen zur Verbesserung der Qualität, Zuverlässigkeit und Ausbeute von Halbleitern.
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FREMONT, CA / ACCESS Newswire / May 29, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson and CFO Chris Siu will be presenting at the William Blair 45th Annual Growth Stock Conference in Chicago on Tuesday, June 3 at 12:40pm CT (10:40pm PT)and will be meeting with institutional investors throughout the day.
You may register to access a live or replay audio webcast of the presentation via a link posted to the investor relations section of Aehr's website at www.aehr.comor by clicking here.
"We look forward to discussing with investors and shareholders our innovative wafer level test and packaged part burn-in solutions for semiconductor production and the diverse markets they serve," said Mr. Erickson. "This includes our acquisition last July of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market. Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors. These include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices, as well as AI processors in both wafer level and packaged part device forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test."
For additional information, or to schedule a meeting with Aehr management, please contact your William Blair representative, or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced AI processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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Contacts:
Aehr Test Systems | PondelWilkinson, Inc. |
SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire
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