Welcome to our dedicated page for Onto Innovation news (Ticker: ONTO), a resource for investors and traders seeking the latest updates and insights on Onto Innovation stock.
Onto Innovation Inc. (ONTO) delivers advanced process control and inspection systems critical for semiconductor manufacturing. This page for comprehensive coverage of corporate developments, including earnings reports, product launches, and strategic partnerships.
Access real-time updates on ONTO's innovations in metrology, defect inspection, and lithography technologies. Investors and industry professionals will find curated press releases and analysis of operational milestones impacting semiconductor production efficiency.
Key updates include quarterly financial results, R&D breakthroughs, and market expansion announcements. Bookmark this page to monitor how ONTO addresses evolving challenges in device miniaturization and manufacturing yield optimization.
Onto Innovation Inc. (NYSE: ONTO) announced its participation in upcoming investor events including the B. Riley Securities 24th Annual Institutional Investor Conference, Stifel 2024 Cross Sector Insight Conference, and Wolfe Research Small and Mid-Cap Conference. Management will be available for one-on-one meetings on specific dates and times at each event.
Onto Innovation reported their financial results for the first fiscal quarter of 2024, with revenue reaching $229 million driven by customer capacity expansions for high-performance computing and high bandwidth memory supporting AI market growth. The GAAP gross margin and non-GAAP gross margin were 52%, with GAAP operating income of $43 million and GAAP net income of $47 million. Non-GAAP operating income was $57 million and non-GAAP net income reached $58 million. First quarter highlights include revenue from specialty and advanced packaging customers reaching a record $161 million, Dragonfly G3 inspection system shipments increasing by over 30%, and new capabilities released for the Dragonfly G3 inspection system enabling 100% wafer inspection for critical sub-surface defects.