/C O R R E C T I O N -- Axcelis Technologies, Inc./
Rhea-AI Summary
Axcelis Technologies (NASDAQ: ACLS) has issued a correction to their previous press release regarding their participation in the Advanced Semiconductor Manufacturing Conference (ASMC). The correction pertains to two coauthor names: Charlie Free (previously listed as David Free) and DaeYoon Kim (previously listed as Dae Yun Kim).
The company will sponsor ASMC, scheduled for May 5-8, 2025, at the Hilton Albany, New York. During Session 5: Contamination Free Manufacturing on May 6, Dr. Phillip Geissbuhler will present research on 'Particle Control for Low-Energy Boron Implantation' at 3:40 PM.
The presentation details a case study on reducing particle contamination during low-energy boron implants through new hardware implementation. The innovation increases ion beam angle to enhance self-sputtering of films, significantly reducing film buildup on surfaces near implanted wafers, thereby improving device yields.
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News Market Reaction 1 Alert
On the day this news was published, ACLS gained 6.44%, reflecting a notable positive market reaction.
Data tracked by StockTitan Argus on the day of publication.
In the news release, Axcelis Announces Participation in Advanced Semiconductor Manufacturing Conference (ASMC), issued 24-Apr-2025 by Axcelis Technologies, Inc. over PR Newswire, we are advised by the company that 2 coauthor names were incorrectly referenced beneath the section titled "Axcelis will present in Session 5: Contamination Free Manufacturing". "David Free" should be listed as "Charlie Free" and "Dae Yun Kim" should read as "DaeYoon Kim". The complete, corrected release follows:
Axcelis Announces Participation in Advanced Semiconductor Manufacturing Conference (ASMC)
Axcelis will present in Session 5: Contamination Free Manufacturing:
May 6, 2025, 3:40 p.m. - 4:00 p.m.
Particle Control for Low-Energy Boron Implantation
Presented by Dr. Phillip Geissbuhler, Staff Scientist, Axcelis Technologies
Coauthors: David Burtner, Charlie Free, Kevin Wenzel, Luke Kim, DaeYoon Kim, BuMin Son (Axcelis Technologies), HunKyu Cha, SangHyun Na (SK Hynix)
Abstract: We present a case study describing how particles added to wafers during dedicated low-energy boron (LEB) implants can be reduced by the implementation of new hardware to reduce the buildup of boron films on beamline components. The new hardware increases the ion beam angle of incidence on beamline component surfaces to enhance self-sputtering of films and significantly reduces the film growth rate on surfaces near the wafer being implanted. This is important because film growth can lead to delamination which is a particle source. Particle adders can reduce device yields.
President and CEO Russell Low, said, "We're pleased to be a part of ASMC 2025 and especially excited about presenting our work on contamination control, which is the result of a technical collaboration with a leading device maker. Axcelis has deep technical expertise in this area, and we look forward to sharing our findings and recommendations to chipmakers that ensure pristine processes to deliver optimized device performance and yield."
About Axcelis:
Axcelis (Nasdaq: ACLS), headquartered in
CONTACTS:
Press/Media Relations Contact:
Maureen Hart
Senior Director, Corporate & Marketing Communications
Telephone: (978) 787-4266
Email: Maureen.Hart@axcelis.com
Axcelis Investor Relations Contact:
David Ryzhik
Senior Vice President, Investor Relations and Corporate Strategy
Telephone: (978) 787-2352
Email: David.Ryzhik@axcelis.com
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SOURCE Axcelis Technologies, Inc.