Aehr Test Systems to Participate in 14th Annual NYC Summit
Rhea-AI Summary
Aehr Test Systems (NASDAQ:AEHR) announced that President and CEO Gayn Erickson will participate in the 14th Annual NYC Summit on December 16, 2025 at Mastro's New York.
The company said the presentation will review growth in its wafer-level burn-in business, recent benchmark evaluation requests for AI processors, and rising demand for package-level burn-in systems including Sonoma, Echo, and Tahoe. Topics listed include turnkey solutions for silicon carbide, gallium nitride, silicon photonics, and traction with AI processor testing. Presentation materials will be available on Aehr's investor relations website at www.aehr.com.
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News Market Reaction
On the day this news was published, AEHR gained 10.24%, reflecting a significant positive market reaction. Argus tracked a peak move of +6.8% during that session. Our momentum scanner triggered 48 alerts that day, indicating elevated trading interest and price volatility. This price movement added approximately $70M to the company's valuation, bringing the market cap to $754M at that time.
Data tracked by StockTitan Argus on the day of publication.
Key Figures
Market Reality Check
Peers on Argus
AEHR gained 5.38% while key peers were mixed, with INDI up 2.05%, ICHR up 1.63%, UCTT up 1.19%, VECO up 1.10%, and COHU down 1.31%, suggesting a more company-specific move.
Historical Context
| Date | Event | Sentiment | Move | Catalyst |
|---|---|---|---|---|
| Dec 03 | Investor conference | Positive | +10.2% | Planned NYC Summit appearance highlighting growth in AI and burn-in demand. |
| Nov 12 | Product shipment | Positive | +0.3% | Dual-Echo shipment and momentum in package-level and wafer-level burn-in. |
| Nov 03 | Strategic partnership | Positive | +0.0% | Partnership with ISE Labs for wafer-level test and burn-in for HPC/AI. |
| Oct 06 | Earnings results | Neutral | +2.0% | Fiscal Q1 2026 results with AI and data-center demand commentary. |
| Sep 29 | Earnings preview | Neutral | +0.9% | Announcement of upcoming fiscal Q1 2026 earnings release and call. |
Recent news around AI, data-center demand, and burn-in momentum generally saw positive price reactions, including today's investor conference update.
Over the last few months, AEHR highlighted growing demand for its wafer-level and package-level burn-in systems, particularly for AI processors and power devices. A fiscal Q1 2026 report showed $11.0M in revenue with a GAAP net loss but solid bookings and backlog. Subsequent news covered a new HPC/AI partnership and shipment momentum in Echo systems. Today’s NYC Summit participation continues this narrative of expanding AI, silicon carbide, and silicon photonics engagement.
Market Pulse Summary
The stock surged +10.2% in the session following this news. A strong positive reaction aligns with the company’s recent pattern, where AI and data-center test themes often preceded gains of up to 10.24%. The NYC Summit appearance reinforces earlier updates on wafer- and package-level burn-in traction. However, prior filings show ongoing equity compensation activity and insider sales, which can matter for supply dynamics. Investors watching sustainability often track bookings of $11.4M, backlog levels, and execution against AI-related demand.
Key Terms
wafer-level burn-in technical
package-level burn-in technical
silicon carbide medical
gallium nitride medical
silicon photonics technical
optical input/output (I/O) technical
AI processors technical
AI-generated analysis. Not financial advice.
FREMONT, CA / ACCESS Newswire / December 3, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced that President and CEO Gayn Erickson will be participating in the 14 th Annual NYC Summit investor conference being held Tuesday, December 16 th at Mastro's New York.
"I'm pleased to once again engage with investors and shareholders to discuss Aehr's expanding role in enabling the next generation of semiconductor devices across a wide range of markets," said Mr. Erickson. "This includes the continued strength we are seeing in our wafer-level burn-in business, with multiple leading companies requesting benchmark evaluations for their AI processors since our last earnings call, and increasing demand for our package-level burn-in solutions including both our ultra-high-power Sonoma systems and our lower-power Echo and Tahoe systems. Aehr delivers complete turnkey solutions that improve the quality, reliability, and yield of semiconductors used in critical applications, including silicon carbide devices in electric vehicles and charging infrastructure, gallium nitride for advanced power conversion, and silicon photonics for data centers, 5G infrastructure and optical input/output (I/O). We are also seeing strong traction with AI processors in both wafer level and packaged part formats. The growing adoption of wafer level test and packaged part burn-in across these markets is a significant growth driver for Aehr Test Systems."
The presentation material referenced by Aehr Test at the NYC Summit may be accessed on the investor relations page of the Company's website at www.aehr.com.
About the 14 th Annual NYC Summit
The NYC Summit is collectively hosted and funded by participating companies and features a "round-robin" format consisting of small group meetings with company management teams. During the event, investors and analysts will have the opportunity to meet with the majority of the 15 management teams during the small group meeting sessions, as well as opportunities to meet with management during the breakfast and lunch networking sessions.
Attendance at the NYC Summit is by invitation only and is available solely to accredited investors and publishing research analysts. As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is December 10, 2025.
RSVP Contacts for 14th Annual NYC Summit 2025
To RSVP for the CEO Investor Summit, please visit the CEO Summit Events website or contact either of the event co-chairs:
Laura J. Guerrant-Oiye
Phone: (808) 960-2642
Email: lauraoiye@gmail.com
Claire E. McAdams
Phone: (530) 265-9899
Email: claire@headgatepartners.com
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and packaged part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced artificial intelligence (AI) processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr's products and solutions. Aehr has developed and introduced several innovative products including the FOX-P TM families of test and burn-in systems and FOX WaferPak TM Aligner, FOX WaferPak Contactor, FOX DiePak ® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full-wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for AI semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turnkey provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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SOURCE: Aehr Test Systems
View the original press release on ACCESS Newswire