Aehr Test Systems to Participate in the 22nd Annual Craig-Hallum Institutional Investor Conference on May 28
Aehr Test Systems (NASDAQ:AEHR), a semiconductor test and burn-in equipment supplier, announced its participation in the 22nd Annual Craig-Hallum Institutional Investor Conference on May 28, 2025, in Minneapolis. CEO Gayn Erickson will conduct one-on-one meetings with investors to discuss the company's wafer level test and packaged part burn-in solutions.
The company will highlight its recent acquisition of Incal Technology and its expanded solutions for the AI semiconductor market. Aehr's technology serves various sectors, including silicon carbide devices for EVs, gallium nitride devices for power conversion, and silicon photonics devices for data centers and 5G infrastructure. The company focuses on improving semiconductor quality, reliability, and yield through its comprehensive solutions.
Aehr Test Systems (NASDAQ:AEHR), fornitore di apparecchiature per test e burn-in nel settore dei semiconduttori, ha annunciato la sua partecipazione alla 22ª Conferenza Annuale per Investitori Istituzionali Craig-Hallum il 28 maggio 2025 a Minneapolis. Il CEO Gayn Erickson terrà incontri individuali con gli investitori per discutere delle soluzioni dell'azienda per il test a livello di wafer e il burn-in di componenti confezionati.
L'azienda metterà in evidenza la recente acquisizione di Incal Technology e le sue soluzioni ampliate per il mercato dei semiconduttori AI. La tecnologia di Aehr serve diversi settori, tra cui dispositivi in carburo di silicio per veicoli elettrici, dispositivi in nitruro di gallio per la conversione di potenza e dispositivi fotonici in silicio per data center e infrastrutture 5G. L'azienda si concentra sul miglioramento della qualità, affidabilità e resa dei semiconduttori attraverso le sue soluzioni complete.
Aehr Test Systems (NASDAQ:AEHR), proveedor de equipos para pruebas y burn-in de semiconductores, anunció su participación en la 22ª Conferencia Anual para Inversores Institucionales Craig-Hallum el 28 de mayo de 2025 en Minneapolis. El CEO Gayn Erickson realizará reuniones individuales con inversores para hablar sobre las soluciones de la compañía para pruebas a nivel de oblea y burn-in de piezas empaquetadas.
La empresa destacará su reciente adquisición de Incal Technology y sus soluciones ampliadas para el mercado de semiconductores de IA. La tecnología de Aehr atiende diversos sectores, incluyendo dispositivos de carburo de silicio para vehículos eléctricos, dispositivos de nitruro de galio para conversión de potencia y dispositivos fotónicos de silicio para centros de datos e infraestructura 5G. La compañía se enfoca en mejorar la calidad, confiabilidad y rendimiento de los semiconductores mediante sus soluciones integrales.
Aehr Test Systems (NASDAQ:AEHR)는 반도체 테스트 및 번인 장비 공급업체로, 2025년 5월 28일 미니애폴리스에서 열리는 제22회 Craig-Hallum 기관 투자자 컨퍼런스에 참여한다고 발표했습니다. CEO 게인 에릭슨은 투자자들과 1:1 미팅을 진행하며 회사의 웨이퍼 레벨 테스트 및 패키지 부품 번인 솔루션에 대해 논의할 예정입니다.
회사는 최근 인칼 테크놀로지(Incal Technology) 인수와 AI 반도체 시장을 위한 확장된 솔루션을 강조할 것입니다. Aehr의 기술은 전기차용 실리콘 카바이드 장치, 전력 변환용 갈륨 나이트라이드 장치, 데이터 센터 및 5G 인프라용 실리콘 포토닉스 장치 등 다양한 분야에 적용됩니다. 회사는 종합 솔루션을 통해 반도체의 품질, 신뢰성 및 수율 향상에 집중하고 있습니다.
Aehr Test Systems (NASDAQ:AEHR), fournisseur d'équipements de test et de burn-in pour semi-conducteurs, a annoncé sa participation à la 22e conférence annuelle des investisseurs institutionnels Craig-Hallum le 28 mai 2025 à Minneapolis. Le PDG Gayn Erickson tiendra des réunions individuelles avec des investisseurs pour discuter des solutions de test au niveau du wafer et de burn-in des composants emballés de l'entreprise.
La société mettra en avant sa récente acquisition d'Incal Technology et ses solutions étendues pour le marché des semi-conducteurs IA. La technologie d'Aehr dessert divers secteurs, notamment les dispositifs en carbure de silicium pour véhicules électriques, les dispositifs en nitrure de gallium pour la conversion d'énergie, ainsi que les dispositifs photoniques en silicium pour les centres de données et les infrastructures 5G. L'entreprise se concentre sur l'amélioration de la qualité, de la fiabilité et du rendement des semi-conducteurs grâce à ses solutions complètes.
Aehr Test Systems (NASDAQ:AEHR), ein Anbieter von Test- und Burn-in-Geräten für Halbleiter, gab seine Teilnahme an der 22. jährlichen Craig-Hallum Institutional Investor Conference am 28. Mai 2025 in Minneapolis bekannt. CEO Gayn Erickson wird Einzelgespräche mit Investoren führen, um die Wafer-Level-Test- und Burn-in-Lösungen des Unternehmens für verpackte Bauteile zu besprechen.
Das Unternehmen wird seine kürzliche Übernahme von Incal Technology und seine erweiterten Lösungen für den KI-Halbleitermarkt hervorheben. Die Technologie von Aehr bedient verschiedene Bereiche, darunter Siliziumkarbid-Geräte für Elektrofahrzeuge, Galliumnitrid-Geräte für die Leistungsumwandlung und Silizium-Photonik-Geräte für Rechenzentren und 5G-Infrastruktur. Das Unternehmen konzentriert sich darauf, die Qualität, Zuverlässigkeit und Ausbeute von Halbleitern durch seine umfassenden Lösungen zu verbessern.
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FREMONT, CA / ACCESS Newswire / May 21, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be participating in one-on-one meetings with investors at the 22nd Annual Craig-Hallum Institutional Investor Conference taking place Wednesday, May 28, 2025 at the Depot Renaissance Hotel in Minneapolis.
"I look forward to discussing with investors and shareholders our innovative wafer level test and packaged part burn-in solutions for semiconductor production and the diverse markets they serve," said Mr. Erickson. "This includes our acquisition last July of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market. Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors. These include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices, as well as AI processors in both wafer level and packaged part device forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test."
For additional information, or to schedule a meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced AI processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
Contacts
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
PondelWilkinson, Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
tkehrli@pondel.com
jbyers@pondel.com
SOURCE: Aehr Test Systems
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