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Microchip Achieves Key Program Milestones for its PIC64-HPSC Spaceflight Computing Series

Microchip Technology (Nasdaq: MCHP) announced early radiation-testing results and customer evaluations for its PIC64-HPSC series of spaceflight computing processors.

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Microchip Technology (Nasdaq: MCHP) announced early radiation-testing results and customer evaluations for its PIC64-HPSC series of spaceflight computing processors.

The radiation-hardened variant demonstrated total ionizing dose tolerance to 200 krad(Si) and passed single-event latch-up testing to 78.2 MeV·cm²/mg under specified operating conditions. System-controller testing completed to date required no external resets and recorded no uncorrected errors. Early Access Program customers are evaluating silicon and development kits and beginning application development. Board partners are developing processor-based computing platforms. Evaluation and development kits remain available to select customers.

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On Oct 27, the day this news came out, the latest delayed price for MCHP is 5.22% above the previous close. Our momentum scanner has recorded 48 alerts for this stock so far that day. The latest delayed price is $79.86.

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Key Figures

Total ionizing dose performance: 200 krad(Si) Single Event Latch-up testing: 78.2 MeV·cm²/mg
Total ionizing dose performance
200 krad(Si)
Early radiation characterization of the PIC64-HPSC1000-RH variant
Single Event Latch-up testing
78.2 MeV·cm²/mg
Successful early testing under specified operating conditions

Key Terms

risc-v, total ionizing dose (tid), single event latch-up (sel), single event effects (see)
4 terms
risc-v technical
"a 64-bit multicore RISC-V computing platform designed specifically for spacecraft"
A royalty-free, open instruction set architecture (ISA) that acts like a blueprint for how a computer’s brain understands and executes commands. Because it is not owned by a single company and can be freely implemented and customized, RISC‑V can lower licensing costs, speed product development, and encourage competition and supply-chain diversification—factors investors watch because they affect margins, market share, and the pace of innovation in chips and devices.
total ionizing dose (tid) technical
"demonstrated Total Ionizing Dose (TID) performance to 200 krad(Si)"
Total ionizing dose (TID) is the cumulative amount of ionizing radiation energy absorbed by a material or device over time, expressed as energy per unit mass (commonly grays, Gy, or rads). It measures the gradual, accumulated damage caused by ionizing radiation (gamma rays, X-rays, electrons) and is used in testing and regulation to quantify long-term degradation of electronic components, materials, and medical devices. TID differs from dose rate (how quickly radiation is delivered) and from single-event effects: it records the total exposure over time and does not describe instantaneous transient faults caused by a single high-energy particle.
single event latch-up (sel) technical
"successful Single Event Latch-up (SEL) testing to 78.2 MeV·cm²/mg"
A single event latch-up (SEL) is a failure mode in integrated circuits where an energetic charged particle (for example from cosmic rays or radioactive decay) strikes the silicon and triggers a parasitic, thyristor-like structure inside CMOS devices, creating a low-resistance path that draws excessive current. The condition can cause the device to stop functioning and can lead to permanent damage or thermal destruction unless the circuit’s power is removed or a protection mechanism clears the latch; SEL is distinct from non-destructive bit flips (single event upset, SEU) because it produces a sustained high-current state rather than a transient change of stored data.
single event effects (see) technical
"during Single Event Effects (SEE) characterization"
Damage or malfunctions in electronic components caused when a single energetic particle (for example a cosmic ray, neutron, or heavy ion) strikes a device and deposits enough charge to change a circuit’s state. Single-event effects include temporary errors like bit flips or transient pulses (single-event upsets and transients) and potentially destructive outcomes such as latch-up, burnout, or permanent functional failure; they are distinguished by whether the effect is transient or causes lasting damage and by the device area or circuit function affected.

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Early radiation results and customer evaluations show progress toward high-performance computing for next-generation space missions

CHANDLER, Ariz., Oct. 27, 2026 (GLOBE NEWSWIRE) -- As civil, commercial, scientific and defense spacecraft become more autonomous, software-defined and data intensive, mission developers need substantially greater onboard processing capability, combined with the resilience, security and reliability required for demanding space environments. Microchip Technology (Nasdaq: MCHP) today announces several important milestones for its PIC64-HPSC High-Performance Spaceflight Computing Series, a 64-bit multicore RISC-V computing platform designed specifically for spacecraft, satellites and other mission-critical space systems.

Early radiation characterization of the PIC64-HPSC1000-RH radiation-hardened variant has demonstrated Total Ionizing Dose (TID) performance to 200 krad(Si) and successful Single Event Latch-up (SEL) testing to 78.2 MeV·cm²/mg under specified operating conditions. Early testing also demonstrated robust system-controller operation during Single Event Effects (SEE) characterization, with no uncorrected errors or external resets required during the testing completed to date. These results provide developers with tangible evidence of the platform’s progress toward meeting radiation-tolerance requirements, helping enable future spaceflight systems from Low Earth Orbit to the Moon, Mars and beyond.

“Our vision for PIC64-HPSC was to develop a modern, high-performance computing platform capable of enabling the next generation of civil, commercial, scientific and defense space systems,” said Kevin So, vice president of Microchip’s communications business unit. “The combination of operational silicon, radiation-characterization results and customer evaluation activity demonstrates continued execution against that vision and marks an important step in the maturation of the platform.”

Through the PIC64-HPSC Early Access Program, participating customers have been evaluating silicon and development kits, and beginning application development with supporting software, tools, technical resources and direct engineering assistance from Microchip. A growing ecosystem of board partners is also developing PIC64-HPSC-based VPX and VNX+ computing platforms, providing additional paths for system developers to integrate the processor into future space systems. The Early Access Program can help space-system developers reduce program risk and advance application development.

Initial silicon performance measurements are in line with program objectives, providing a foundation for increasingly compute-intensive workloads such as onboard autonomy, high-performance payload processing, Earth observation and intelligence, secure communications, spacecraft control, scientific exploration and edge AI. By processing more sensor and mission data onboard, future spacecraft can reduce dependence on communications bandwidth, shorten decision-making latency and respond more rapidly to changing mission conditions. The importance of advanced onboard processing is also reflected in NASA’s FY26 Civil Space Shortfall Prioritization, which ranked advanced onboard computing for space operations as the third-highest civil space technology shortfall.

PIC64-HPSC is designed as a scalable computing foundation for a broad range of next-generation space systems. Its 64-bit multicore RISC-V architecture supports the industry’s move toward more open and scalable models for onboard autonomy, software-defined spacecraft, distributed processing, deterministic communications and heterogeneous computing.

PIC64-HPSC originated from NASA and JPL’s assessment of future spaceflight computing requirements and awarded the HPSC contract to Microchip in 2022. Today, operational silicon, customer evaluations and early radiation-characterization achievements reflect the program's progress to date.

The HPSC program helped establish the foundation for Microchip’s 64-bit computing portfolio, which the company has since expanded its portfolio of PIC64 MPUs addressing performance requirements across a broad range of markets.

Pricing and Availability

PIC64-HPSC evaluation and development kits are available to select customers, providing access to silicon, development platforms, software, tools and Microchip engineering support. To inquire about availability, contact a Microchip sales representative.

Resources

High-res images available through Flickr or editorial contact (feel free to publish):
• Application image: www.flickr.com/photos/microchiptechnology/55590867877/sizes/l

About Microchip Technology:
Microchip Technology Inc. is a broadline supplier of semiconductors committed to making innovative design easier through total system solutions that address critical challenges at the intersection of emerging technologies and durable end markets. Its easy-to-use development tools and comprehensive product portfolio supports customers throughout the design process, from concept to completion. Headquartered in Chandler, Arizona, Microchip offers outstanding technical support and delivers solutions across the industrial, automotive, consumer, aerospace and defense, communications and computing markets. For more information, visit the Microchip website at www.microchip.com. 

Note: The Microchip name and logo and the Microchip logo are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. All other trademarks mentioned herein are the property of their respective companies.

Editorial Contact: 
Kim Dutton 
kim.dutton@microchip.com 



FAQ

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What radiation-testing results did Microchip report for PIC64-HPSC?

Early testing of the PIC64-HPSC1000-RH variant demonstrated total ionizing dose performance to 200 krad(Si) and successful single-event latch-up testing to 78.2 MeV·cm²/mg under specified operating conditions. During single-event-effects testing completed to date, the system controller had no uncorrected errors and required no external resets.

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