Samsung Electronics and Nova Jointly awarded the Vladimir Ukraintsev Award at the SPIE Advanced Lithography conference

Rhea-AI Summary

Nova (Nasdaq: NVMI) and Samsung Electronics have been jointly awarded the Vladimir Ukraintsev Award for 'Collaborations in Metrology' at SPIE's 2024 Advanced Lithography + Patterning Conference. The recognition comes for their co-authored paper on chalcogenide alloy layer monitoring using advanced technologies.

The award-winning research demonstrates a novel approach to monitoring the thickness of chalcogenide Ovonic Threshold Switching (OTS) layer, a critical parameter in Selector-Only Memory (SOM) process control. The solution combines Spectral Interferometry, Raman Spectroscopy, and Machine Learning algorithms to achieve precise monitoring and control of the chalcogenide layer.

Dr. Shay Wolfling, Nova's Chief Technology Officer, highlighted how this collaboration demonstrates Nova's ability to leverage innovative technologies for advanced semiconductor device process control.

Positive

• Recognition of Nova's technological leadership through prestigious industry award
• Strategic collaboration with Samsung Electronics, a major industry player
• Successful development of innovative metrology solution for advanced semiconductor manufacturing

Negative

• None.

REHOVOT, Israel, March 18, 2025 /PRNewswire/ -- Nova (Nasdaq: NVMI) today announced that its co-authored paper with Samsung Electronics on "On-Cell Thickness Monitoring of Chalcogenide Alloy Layer using Spectral Interferometry, Raman Spectroscopy, and Hybrid Machine Learning" has been selected as the winner of the Vladimir Ukraintsev Award for "Collaborations in Metrology" at SPIE's 2024 Advanced Lithography + Patterning Conference.

 

The award was granted to Nova and Samsung on the opening day of the 2025 conference. The paper is a result of continuous collaboration between the companies to explore innovative approaches to metrology in advanced chip manufacturing. The paper demonstrates the application of Nova's novel technologies in advanced process control by utilizing its unique and differentiated solutions.

The thickness of the chalcogenide Ovonic Threshold Switching (OTS) layer is one of the most critical parameters for the Selector-Only Memory (SOM) process control. In this work, we successfully demonstrated an alternative approach to enable precise monitoring and control of the chalcogenide layer using hybrid metrology consisting of Spectral Interferometry, Raman Spectroscopy and Machine Learning algorithms. The paper details how these advanced techniques were applied to achieve accurate thickness monitoring, ensuring optimal performance and reliability of SOM devices.

"We are honored to receive this prestigious award in collaboration with Samsung Electronics," said Dr. Shay Wolfling, Chief Technology Officer of Nova. "This collaboration showcases Nova's capability to leverage its unique innovative technologies, facilitating process control in the most advanced semiconductor devices. We continue to expand our solutions and enhance synergies within our portfolio, in collaboration with our leading customers, to address the growing challenges in advanced node manufacturing." 

About Nova

Nova is a leading innovator and key provider of material, optical and chemical metrology solutions for advanced process control in semiconductor manufacturing. Nova delivers continuous innovation by providing state-of-the-art, high-performance metrology solutions for effective process control throughout the semiconductor fabrication lifecycle. Nova's product portfolio, which combines high-precision hardware and cutting-edge software, provides its customers with deep insight into developing and producing the most advanced semiconductor devices. Nova's unique capability to deliver innovative solutions enables its customers to improve performance, enhance product yields, and accelerate time to market. Nova acts as a partner to semiconductor manufacturers from its offices worldwide. Additional information may be found on Nova's website link - https://www.novami.com/.

Nova is traded on the Nasdaq and TASE, Nasdaq ticker symbol NVMI.

Forward-Looking Statements

This press release contains forward-looking statements within the meaning of safe harbor provisions of the Private Securities Litigation Reform Act of 1995 relating to future events or our future performance, such as statements regarding, but not limited to, anticipated growth opportunities and projections about our business and its future revenues, expenses and profitability. Forward-looking statements involve known and unknown risks, uncertainties and other factors that may cause our actual results, levels of activity, performance or achievements to differ materially from any future results, levels of activity, performance or achievements expressed or implied in those forward-looking statements. Factors that may affect our results, performance, circumstances or achievements include, but are not limited to, the following:  risks related to information technology security threats, sophisticated computer crime, and data privacy; foreign political and economic risks including supply-chain difficulties; regulations that could restrict our operations such as economic sanctions and export restrictions; changes in U.S. trade policies and taxation; indirect effects of the Russia – Ukraine conflict; market instability including inflation and recessionary pressures; risks related to doing business with China; catastrophic events; inability to protect our intellectual property; open source technology exposure, including risks related to artificial intelligence; risks related to the use of artificial intelligence technologies; challenges related to our new ERP system; failure to compete effectively or to respond to rapid technological changes; consolidation in our industry; difficulty in predicting the length and strength of any downturn or expansion period of the market we target; factors that adversely affect the pricing and demand for our product lines; dependency on a small number of large customers; dependency on a single manufacturing facility per product line; dependency on a limited number of suppliers; difficulty in integrating current or future acquisitions; lengthy sales cycle and customer delays in orders; risks related to conditions in Israel, including Israel's conflicts with Hamas and other parties in the region; risks related to our convertible notes; currency fluctuations; and quarterly fluctuations in our operating results. We cannot guarantee future results, levels of activity, performance or achievements. The matters discussed in this press release also involve risks and uncertainties summarized under the heading "Risk Factors" in Nova's Annual Report on Form 20-F for the year ended December 31, 2024, filed with the Securities and Exchange Commission on February 20, 2025. These factors are updated from time to time through the filing of reports and registration statements with the Securities and Exchange Commission. Nova Ltd. does not assume any obligation to update the forward-looking information contained in this press release.

Company Contact:
Guy Kizner, Chief Financial Officer
Tel: +972-73-229-5760
E-mail - investors@novami.com
Nova website link - https://www.novami.com/

Investor Relations Contact:
Miri Segal MS-IR LLC
E-mail - msegal@ms-ir.com

Logo - https://mma.prnewswire.com/media/1446151/3817156/Nova_Logo.jpg

View original content:https://www.prnewswire.com/news-releases/samsung-electronics-and-nova-jointly-awarded-the-vladimir-ukraintsev-award-at-the-spie-advanced-lithography-conference-302404374.html

SOURCE Nova

FAQ

What technology breakthrough did Nova (NVMI) and Samsung achieve in semiconductor manufacturing?

They developed a hybrid metrology solution combining Spectral Interferometry, Raman Spectroscopy, and Machine Learning for precise monitoring of chalcogenide layer thickness in SOM devices.

What award did Nova (NVMI) receive at SPIE's 2024 Advanced Lithography conference?

Nova and Samsung received the Vladimir Ukraintsev Award for 'Collaborations in Metrology' for their joint research paper.

How does Nova's (NVMI) new metrology solution improve semiconductor manufacturing?

It enables precise monitoring and control of the chalcogenide OTS layer thickness, which is important for Selector-Only Memory process control and device performance.

What is the significance of Nova's (NVMI) collaboration with Samsung Electronics?

The collaboration demonstrates Nova's capability to develop innovative solutions for advanced node manufacturing challenges through partnerships with leading customers.