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Aehr Test Systems (AEHR) provides critical semiconductor testing technologies for automotive, AI, and power electronics markets. This news hub offers investors and industry professionals centralized access to official updates and market developments.
Track earnings announcements, product launches for FOX-series test systems, and strategic partnerships impacting wafer-level burn-in solutions. Discover how AEHR's innovations in silicon carbide and gallium nitride testing address evolving manufacturing challenges.
Our curated news collection enables informed decision-making with verified press releases and objective analysis of AEHR's role in semiconductor reliability testing. Bookmark this page for real-time updates on test system deployments, financial performance, and industry recognition.
Aehr Test Systems (NASDAQ:AEHR), a global supplier of semiconductor test and burn-in equipment, will present at the William Blair 44th Annual Growth Stock Conference in Chicago on June 5 at 2:00pm CT. President and CEO Gayn Erickson and CFO Chris Siu will discuss the company's wafer level test and burn-in solutions for semiconductor production, focusing on markets such as electric vehicles, data centers, and 5G infrastructure. The presentation will be webcast live and available for replay. Investors can contact William Blair or MKR Investor Relations for more details or to schedule meetings.
Aehr Test Systems (NASDAQ: AEHR) will participate in the 21st Annual Craig-Hallum Institutional Investor Conference on May 29, 2024, in Minneapolis. President and CEO Gayn Erickson will hold one-on-one meetings with investors to discuss the company's wafer level test and burn-in solutions for semiconductor production. Aehr Test offers solutions for improving the quality, reliability, and yield of semiconductors used in electric vehicles, power conversion applications, and data centers. The company sees significant growth potential in the adoption of these solutions for new applications like optical I/O and co-packaged optics devices.
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