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Nova Announces Second-Generation Metrion® for In-Line Secondary Ion Mass Spectrometry

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Nova (NVMI) announces the release of the second-generation Nova Metrion® system for in-line secondary ion mass spectrometry, featuring increased sensitivity, enhanced charge compensation, and unique in-line composition profiling capabilities. The new version promises faster time to results, improved dopant uniformity control, and better depth resolution. The platform will be installed at several leading customers for qualification in production lines for advanced memory and logic devices. Initial revenues are expected in the latter half of 2024.
Positive
  • Enhanced sensitivity and charge compensation of the new Metrion® system
  • Unique in-line composition profiling capability for key process control measurements
  • Faster time to results, improved dopant uniformity control, and better depth resolution
  • Expected surge of customer interest in Nova's solutions
  • Anticipated initial revenues from the second-generation Nova Metrion® in the latter half of 2024
Negative
  • The potential risk of customer interest not translating into actual sales or revenue
  • The need for extensive customer demonstrations and qualification process before installation
  • The time gap until the expected initial revenues from the new system

The introduction of Nova's second-generation Nova Metrion® system represents a significant advancement in the semiconductor manufacturing industry. The enhanced features such as increased sensitivity, enhanced charge compensation and improved dopant uniformity control cater to the industry's push towards more complex and miniaturized devices. Given that the semiconductor sector is highly competitive and driven by technological innovation, the ability to provide in-line composition profiling capabilities could be a game-changer for Nova, potentially increasing its market share and strengthening customer loyalty.

From a market perspective, the successful integration of such systems into advanced memory and logic device production lines could lead to an increase in operational efficiency for Nova's customers. This efficiency gain could translate into a competitive edge for these customers, which in turn could result in higher demand for Nova's products. The anticipation of initial revenues in the latter half of 2024 suggests a cautious but positive outlook for the company's financial performance.

With the expected recognition of initial revenues from the new Metrion® system in the latter half of 2024, investors will likely monitor the company's financials closely for signs of growth. The product's time to results and the depth resolution improvements are critical factors that can influence the adoption rate among semiconductor manufacturers. A faster adoption could lead to a positive impact on Nova's revenue streams in the short to medium term.

It is also important to consider the capital expenditure involved in the development and marketing of new technology. The return on investment for Nova will depend on the volume of sales and the speed of market penetration. The company's current financial health, existing purchase orders and evaluation agreements will be key indicators of the system's potential success and its impact on the stock's performance.

The semiconductor industry is characterized by rapid innovation cycles and a continuous need for higher precision in manufacturing. Nova's second-generation Metrion® system, with its novel detection technology and in-line compositional analysis, addresses these needs directly. The system's ability to integrate wafer-level analysis into an automated factory workflow is particularly noteworthy, as it eliminates the reliance on external laboratories, thereby reducing the time and cost associated with materials profile measurements.

The mention of extensive customer demonstrations and planned installations at leading customers' production lines suggests a strong industry interest. This could be indicative of a broader trend where in-line SIMS technology becomes an industry standard. If Nova's Metrion® system proves to be as indispensable as suggested, it could lead to long-term strategic partnerships and potentially reshape quality control benchmarks within the industry.

REHOVOT, Israel, Jan. 16, 2024 /PRNewswire/ -- Nova (Nasdaq: NVMI) announces the second-generation Nova Metrion® system for in-line secondary ion mass spectrometry (SIMS).

 

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The new Metrion® incorporates key improvements, including increased sensitivity and enhanced charge compensation, and is now available for shipment to customers. The Metrion® system introduces a unique in-line composition profiling capability for key process control measurements, including contamination, residues, and diffusion, which cannot be obtained by other measurement techniques. This latest version also delivers faster time to results, improved dopant uniformity control, and better depth resolution.

The new Metrion® has gone through extensive customer demonstrations in 2023. Based on existing purchase orders and evaluation agreements, the platform will be installed at several leading customers to undergo a qualification process in production lines for the most advanced memory and logic devices.

"Nova's unique materials metrology offering is quickly becoming critical to the successful manufacturing of next-generation devices," said Gaby Waisman, Nova's President and CEO. "We've seen a surge of customer interest in our solutions over the past year, due to the distinctive value they bring to the advanced production lines. Our conversations with customers indicate that the Nova Metrion®, Elipsonand VeraFlex® are becoming indispensable in next-generation device manufacturing."

The Company expects to recognize initial revenues from the second-generation Nova Metrion® in the latter half of 2024.

Nova Metrion® enables advanced materials profile measurements by bringing secondary ion mass spectrometry into semiconductor production lines. It is designed from the ground up for high-volume manufacturing, seamlessly integrating wafer-level analysis into an automated factory workflow and eliminating the need to send wafer coupons to an external laboratory. The system deploys a novel detection technology that allows simultaneous acquisition of multiple material species, resulting in higher data density, better depth resolution, and greater sensitivity to small changes in concentration.

About Nova

Nova is a leading innovator and key provider of material, optical and chemical metrology solutions for advanced process control in semiconductor manufacturing. Nova delivers continuous innovation by providing state-of-the-art, high-performance metrology solutions for effective process control throughout the semiconductor fabrication lifecycle. Nova's product portfolio, which combines high-precision hardware and cutting-edge software, provides its customers with deep insight into developing and producing the most advanced semiconductor devices. Nova's unique capability to deliver innovative solutions enables its customers to improve performance, enhance product yields, and accelerate time to market. Nova acts as a partner to semiconductor manufacturers from its offices worldwide. Additional information may be found on Nova's website link: https://www.novami.com.

Nova is traded on the Nasdaq and TASE, Nasdaq ticker symbol NVMI.

Forward-Looking Statements

This press release contains forward-looking statements within the meaning of safe harbor provisions of the Private Securities Litigation Reform Act of 1995 relating to future events or our future performance, such as statements regarding, but not limited to, anticipated growth opportunities and projections about our business and its future revenues, expenses and profitability. Forward-looking statements involve known and unknown risks, uncertainties and other factors that may cause our actual results, levels of activity, performance or achievements to differ materially from any future results, levels of activity, performance or achievements expressed or implied in those forward-looking statements. Factors that may affect our results, performance, circumstances or achievements include, but are not limited to, the following: political, economic and military instability in Israel, including related to the recent attack by Hamas and other terrorist organizations from the Gaza Strip and Israel's war against them; increased information technology security threats and sophisticated computer crime; foreign political and economic risks including supply-chain difficulties; regulations that could restrict our operations such as economic sanctions and export restrictions; changes in U.S. trade policies; indirect effects of the RussiaUkraine conflict; market instability including inflation and recessionary pressures; risks related to doing business with China; catastrophic events such as the outbreak of COVID-19; inability to protect our intellectual property; open source technology exposure; failure to compete effectively or to respond to rapid technological changes; consolidation in our industry; difficulty in predicting the length and strength of any downturn or expansion period of the market we target; factors that adversely affect the pricing and demand for our product lines; dependency on a small number of large customers; dependency on a single manufacturing facility per product line; dependency on a limited number of suppliers; difficulty in integrating current or future acquisitions; lengthy sales cycle and customer delays in orders; risks related to our convertible notes; currency fluctuations; and quarterly fluctuations in our operating results. We cannot guarantee future results, levels of activity, performance or achievements. The matters discussed in this press release also involve risks and uncertainties summarized under the heading "Risk Factors" in Nova's Annual Report on Form 20-F for the year ended December 31, 2022, filed with the Securities and Exchange Commission on February 28, 2023. These factors are updated from time to time through the filing of reports and registration statements with the Securities and Exchange Commission. Nova Ltd. does not assume any obligation to update the forward-looking information contained in this press release.

Logo: https://mma.prnewswire.com/media/1446151/Nova_Logo.jpg

Company contact:
Dror David, Chief Financial Officer
Tel: +972-73-229-5760
E-mail: investors@novami.com
Nova website link: https://www.novami.com

Investor Relations contact:
Miri Segal MS-IR LLC
Tel: +917-607-8654
E-mail: msegal@ms-ir.com

Cision View original content:https://www.prnewswire.com/news-releases/nova-announces-second-generation-metrion-for-in-line-secondary-ion-mass-spectrometry-302035550.html

SOURCE Nova

FAQ

What is the new Nova (NVMI) product being announced?

The second-generation Nova Metrion® system for in-line secondary ion mass spectrometry.

What are the key improvements of the new Metrion® system?

Increased sensitivity, enhanced charge compensation, and unique in-line composition profiling capabilities.

When are the initial revenues from the second-generation Nova Metrion® expected?

In the latter half of 2024.

What does the new Metrion® system promise in terms of results and control?

Faster time to results, improved dopant uniformity control, and better depth resolution.

What is the expected impact of the new Metrion® system on customer interest?

A surge of customer interest in Nova's solutions.

What is the purpose of the extensive customer demonstrations and qualification process?

To install the platform at several leading customers for qualification in production lines for advanced memory and logic devices.

Nova Ltd.

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Optical Instrument and Lens Manufacturing
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About NVMI

nova measuring instruments ltd. is a leading provider of advanced, high-throughput metrology solutions for semiconductor manufacturing worldwide. used by over 80% of the largest integrated-circuit manufacturers, nova’s solutions deliver the high-volume complex measurements required for effective process control. nova offers a selection of integrated and stand-alone metrology platforms, which are complimented by the powerful novamars® modeling engine. this flexible offering enables nova to partner with semiconductor manufacturers throughout the entire product lifecycle; from application development to high-volume production. featuring a unique combination of spectroscopic reflectrometry and scatterometry, nova’s metrology solutions measure a wide variety of features and parameters including cd, trench depth, photoresist height, thickness and shape of complex layer stacks. with nova, you get the tight wafer-to-wafer and within-wafer control necessary to develop and produce advance